Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
نویسندگان
چکیده
0026-2714/$ see front matter 2013 Elsevier Ltd. All rights reserved. http://dx.doi.org/10.1016/j.microrel.2013.07.013 ⇑ Corresponding author. Tel.: +39 049 827 7664; fax: +39 049 827 7699. E-mail address: [email protected] (M. Meneghini). Alessandro Compagnin , Matteo Meneghini a,⇑, Marco Barbato , Valentina Giliberto , Andrea Cester , Massimo Vanzi , Giovanna Mura , Enrico Zanoni , Gaudenzio Meneghesso a,b
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عنوان ژورنال:
- Microelectronics Reliability
دوره 53 شماره
صفحات -
تاریخ انتشار 2013